Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films

C. W. Luo, S. J. Liu, M. H. Chen, K. H. Wu*, J. Y. Lin, J. M. Chen, J. Y. Juang, T. M. Uen, Y. S. Gou

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


Polarization-dependent X-ray absorption spectra (XAS) on the O 1s edge has been measured on a highly in-plane aligned (1 0 0) a-axis YBa2Cu3O7-δ (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (E∥b or E∥c), were obtained in a normal-incidence alignment. Furthermore, the XAS for E∥a was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals.

Original languageEnglish
Pages (from-to)435-436
Number of pages2
JournalPhysica C: Superconductivity and its applications
Publication statusPublished - 2003 May
Externally publishedYes
Eventproceedings of the 23rd international conference on low temper - Hiroshima, Japan
Duration: 2002 Aug 202002 Aug 27


  • Polarization-dependent X-ray absorption spectroscopy
  • XAS of E∥a, E∥b, and E∥c
  • a-axis oriented YBaCuO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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