Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films

C. W. Luo, S. J. Liu, M. H. Chen, K. H. Wu, J. Y. Lin, J. M. Chen, J. Y. Juang, T. M. Uen, Y. S. Gou

Research output: Contribution to journalConference articlepeer-review


Polarization-dependent X-ray absorption spectra (XAS) on the O 1s edge has been measured on a highly in-plane aligned (1 0 0) a-axis YBa2Cu3O7-δ (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (E∥b or E∥c), were obtained in a normal-incidence alignment. Furthermore, the XAS for E∥a was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals.

Original languageEnglish
Pages (from-to)435-436
Number of pages2
JournalPhysica C: Superconductivity and its applications
Publication statusPublished - 2003 May
Eventproceedings of the 23rd international conference on low temper - Hiroshima, Japan
Duration: 2002 Aug 202002 Aug 27


  • Polarization-dependent X-ray absorption spectroscopy
  • XAS of E∥a, E∥b, and E∥c
  • a-axis oriented YBaCuO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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