Photoluminescence and Raman studies of nanocrystalline silicon enclosed in a SiO 2 shell

Te Yu Chien, Chi-Ta Chia, Tse Chi Lin, Si Chen Lee

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Spherical silicon-nanocrystals prepared by the thermal evaporation method were examined using Raman and photoluminescence measurements. The Raman analysis indicates that the content of the crystalline silicon decayed exponentially over time, which explains the reduction in size of the silicon-nanocrystals caused by oxidation. The visible photoluminescence spectra of silicon-nanocrystals are about the same. Although the size of the samples varied significantly, the temporal variation of the photoluminescence spectra was negligible, except for the very first day when samples were taken out from the growth chamber. Based on the Raman and photoluminescence results, we conclude that the red photoluminescence of silicon-nanocrystals near 680 nm is mainly attributed to defect states residing at the Si/SiO 2 interfaces.

Original languageEnglish
Pages (from-to)91-97
Number of pages7
JournalChinese Journal of Physics
Volume46
Issue number1
Publication statusPublished - 2008 Feb 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Photoluminescence and Raman studies of nanocrystalline silicon enclosed in a SiO <sub>2</sub> shell'. Together they form a unique fingerprint.

  • Cite this