Abstract
Ni films, replacing photoresists, serve as masks in the selective deposition of optical thin films by electron-beam gun evaporation at a substrate temperature of 300°C. Photolithography is adopted herein to define the growth of Ni films by electroforming. Mosaic patterns with a width of 20 μm are employed as red color filters, which are longwave pass. These red filters are formed from alternate SiO2 and TiO2 layers and have a mean transmittance of (90%. The experimental results show that the combined use of photolithography, electroforming, and electron-beam gun evaporation can deposit miniaturized multilayer dielectric coatings with high light transmittance in a hot process.
Original language | English |
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Article number | 033009 |
Journal | Journal of Micro/Nanolithography, MEMS, and MOEMS |
Volume | 8 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2009 |
Keywords
- Electroforming
- Electron-beam gun evaporation
- Hot process
- Mask
- Miniaturized multilayer dielectric coatings
- Photolithography
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Mechanical Engineering
- Electrical and Electronic Engineering