Parameter dependence of two-dimensional ordered structures in magnetic fluid thin films subjected to perpendicular fields

Chin Yih Hong, C. H. Ho, H. E. Horng, Chun Hui Chen, S. Y. Yang, Y. P. Chiu, H. C. Yang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

When a magnetic fluid thin fdm is subjected to a magnetic field perpendicular to the plane of the film, a portion of the magnetic particles is condensed out from the initially monodispersed magnetic fluid and forms magnetic columns. These columns evolve from a disordered column phase to a two-dimensional ordered structural pattern as the field strength increases further. The ordered structural pattern can be characterized by the distance between columns occupying the vertices of the structural lattice. The character distance can be affected by several parameters, such as the applied magnetic field strength, the sweep rale of the field, the thickness of the magnetic fluid thin film, the concentration of magnetic fluids, and the fluid temperature. In this work, we will demonstrate the character distance of the ordered structures as functions of these control parameters. The results show that an increase of the field strength, the sweep rate and of the concentration of the magnetic fluid reduces the character distance. On the other hand, the thickness of the thin film and the temperature of the fluid tend to increase the distance.

Original languageEnglish
Pages (from-to)297-302
Number of pages6
JournalMagnetohydrodynamics
Volume35
Issue number4
Publication statusPublished - 1999 Jan 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Parameter dependence of two-dimensional ordered structures in magnetic fluid thin films subjected to perpendicular fields'. Together they form a unique fingerprint.

Cite this