Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Hsiang Lin Liu*, Chih Chiang Shen, Sheng Han Su, Chang Lung Hsu, Ming Yang Li, Lain Jong Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

334 Citations (Scopus)

Abstract

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.

Original languageEnglish
Article number201905
JournalApplied Physics Letters
Volume105
Issue number20
DOIs
Publication statusPublished - 2014 Nov 17

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry'. Together they form a unique fingerprint.

Cite this