Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Hsiang Lin Liu, Chih Chiang Shen, Sheng Han Su, Chang Lung Hsu, Ming Yang Li, Lain Jong Li

Research output: Contribution to journalArticle

159 Citations (Scopus)

Abstract

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.

Original languageEnglish
Article number201905
JournalApplied Physics Letters
Volume105
Issue number20
DOIs
Publication statusPublished - 2014 Nov 17

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ellipsometry
transition metals
refractivity
optical properties
optoelectronic devices
energy bands
binding energy
frequency ranges
excitons
vapors
electronic structure
orbits

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry. / Liu, Hsiang Lin; Shen, Chih Chiang; Su, Sheng Han; Hsu, Chang Lung; Li, Ming Yang; Li, Lain Jong.

In: Applied Physics Letters, Vol. 105, No. 20, 201905, 17.11.2014.

Research output: Contribution to journalArticle

Liu, Hsiang Lin ; Shen, Chih Chiang ; Su, Sheng Han ; Hsu, Chang Lung ; Li, Ming Yang ; Li, Lain Jong. / Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry. In: Applied Physics Letters. 2014 ; Vol. 105, No. 20.
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