Abstract
Intrinsic defects and their concentrations in hexagonal boron nitride (h-BN) play a key role in single-photon emission. In this study, the optical properties of large-area multilayer h-BN-on-sapphire grown by metal-organic chemical vapor deposition are explored. Based on the detailed spectroscopic characterization using both cathodoluminescence (CL) and photoluminescence (PL) measurements, the material is devoid of random single-point defects instead of a few clustered complex defects. The emission spectra of the measurements confirm a record-low-defect concentration of ≈104 cm−2. Post-annealing, no significant changes are observed in the measured spectra and the defect concentrations remain unaltered. Through CL and PL spectroscopy, an optically active boron vacancy spin defect is identified and a novel complex defect combination arising from carbon impurities is revealed. This complex defect, previously unreported, signifies a unique aspect of the material. In these findings, the understanding of defect-induced optical properties in h-BN films is contributed, providing insights for potential applications in quantum information science.
| Original language | English |
|---|---|
| Article number | 2400034 |
| Journal | Physica Status Solidi - Rapid Research Letters |
| Volume | 18 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2024 Jun |
Keywords
- cathodoluminescence
- clustered point defects
- hexagonal boron nitride
- low-defect densities
- photoluminescence
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
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