Optical characterization of wurtzite gallium nitride nanowires

M. W. Lee*, H. Z. Twu, C. C. Chen, C. H. Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)


The optical properties of the gallium nitride (GaN) nanowires are examined by the transmission method in the ultraviolet-visible range (1-5 eV) and by the reflection method in the infrared range (500-4000 cm-1). The absorption edge of the GaN nanowires is blueshifted by 0.2 eV from the bulk edge. The temperature dependence of the energy gap is expressed by, Eg(T) = 3.724-9.97 × 10-4/(861+ T) eV. The plasma frequency and the free-carrier density of the GaN nanowires, deduced from the infrared reflectance minima, are estimated to be ωp=1100±120cm-1 and nf = 3.73 × 1017cm-3, respectively. Obtaining the free-carrier density from the infrared reflectance spectra is especially useful in research on nanostructured semiconductors.

Original languageEnglish
Pages (from-to)3693-3695
Number of pages3
JournalApplied Physics Letters
Issue number22
Publication statusPublished - 2001 Nov 26

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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