On the reverse short-channel effect and threshold voltage roll-off controls for 90 nm node MOSFETs

Shuang Yuan Chen*, Chia Hao Tu, Jung Chun Lin, Ying Tsung Chen, Sheng Jun Zhuang, Heng Sheng Huang, Chuan Hsi Liu, Sam Chou, Joe Ko

*Corresponding author for this work

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Engineering & Materials Science