On-chip ESD protection designs in RF integrated circuits for radio and wireless applications

Ming Dou Ker, Chun Yu Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CMOS technology has been used to implement the radio and wireless integrated circuits. However, the thinner gate oxide in nanoscale CMOS technology seriously degrades the electrostatic discharge (ESD) robustness. Therefore, on-chip ESD protection designs must be added at all input/output pads in CMOS chip. To minimize the impacts from ESD protection design on circuit performances, ESD protection at input/output pads must be carefully designed. A review on ESD protection designs with low parasitic capacitance for radio and wireless applications is presented in this paper. The comparisons among these ESD protection designs are also discussed.

Original languageEnglish
Title of host publication2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013 - Hong Kong, Hong Kong
Duration: 2013 Jun 32013 Jun 5

Publication series

Name2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013

Other

Other2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013
Country/TerritoryHong Kong
CityHong Kong
Period2013/06/032013/06/05

Keywords

  • Electrostatic discharge (ESD)
  • low capacitance
  • radio-frequency (RF)

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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