TY - GEN
T1 - On-chip ESD protection designs in RF integrated circuits for radio and wireless applications
AU - Ker, Ming Dou
AU - Lin, Chun Yu
PY - 2013
Y1 - 2013
N2 - CMOS technology has been used to implement the radio and wireless integrated circuits. However, the thinner gate oxide in nanoscale CMOS technology seriously degrades the electrostatic discharge (ESD) robustness. Therefore, on-chip ESD protection designs must be added at all input/output pads in CMOS chip. To minimize the impacts from ESD protection design on circuit performances, ESD protection at input/output pads must be carefully designed. A review on ESD protection designs with low parasitic capacitance for radio and wireless applications is presented in this paper. The comparisons among these ESD protection designs are also discussed.
AB - CMOS technology has been used to implement the radio and wireless integrated circuits. However, the thinner gate oxide in nanoscale CMOS technology seriously degrades the electrostatic discharge (ESD) robustness. Therefore, on-chip ESD protection designs must be added at all input/output pads in CMOS chip. To minimize the impacts from ESD protection design on circuit performances, ESD protection at input/output pads must be carefully designed. A review on ESD protection designs with low parasitic capacitance for radio and wireless applications is presented in this paper. The comparisons among these ESD protection designs are also discussed.
KW - Electrostatic discharge (ESD)
KW - low capacitance
KW - radio-frequency (RF)
UR - http://www.scopus.com/inward/record.url?scp=84890499289&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890499289&partnerID=8YFLogxK
U2 - 10.1109/EDSSC.2013.6628166
DO - 10.1109/EDSSC.2013.6628166
M3 - Conference contribution
AN - SCOPUS:84890499289
SN - 9781467325233
T3 - 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013
BT - 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013
T2 - 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013
Y2 - 3 June 2013 through 5 June 2013
ER -