TY - GEN
T1 - On-chip ESD protection design for radio-frequency power amplifier with large-swing-tolerance consideration
AU - Li, Guan Yi
AU - Lin, Chun Yu
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/1/3
Y1 - 2017/1/3
N2 - To effectively protect the radio-frequency (RF) integrated circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, the on-chip ESD protection circuits must be added at the pads that may be stressed by ESD. In this paper, a large-swing-tolerant ESD protection circuit is presented to protect the gigahertz large-swing power amplifier (PA). The proposed ESD protection circuit of diode string with embedded silicon-controlled rectifier (DSSCR) has been designed, fabricated, and verified in silicon chip. With the better RF performances and ESD robustness, the DSSCR can be further applied to the large-swing PA.
AB - To effectively protect the radio-frequency (RF) integrated circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, the on-chip ESD protection circuits must be added at the pads that may be stressed by ESD. In this paper, a large-swing-tolerant ESD protection circuit is presented to protect the gigahertz large-swing power amplifier (PA). The proposed ESD protection circuit of diode string with embedded silicon-controlled rectifier (DSSCR) has been designed, fabricated, and verified in silicon chip. With the better RF performances and ESD robustness, the DSSCR can be further applied to the large-swing PA.
KW - Diode string
KW - electrostatic discharge (ESD)
KW - power amplifier (PA)
KW - silicon-controlled rectifier (SCR)
UR - http://www.scopus.com/inward/record.url?scp=85011024378&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85011024378&partnerID=8YFLogxK
U2 - 10.1109/APCCAS.2016.7803948
DO - 10.1109/APCCAS.2016.7803948
M3 - Conference contribution
AN - SCOPUS:85011024378
T3 - 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
SP - 258
EP - 261
BT - 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
Y2 - 25 October 2016 through 28 October 2016
ER -