Abstract
The fusion of volatile and nonvolatile memory within a complementary-dynamic random-access memory (C-DRAM) in one cell is proposed with antiferroelectric-like hafnium-zirconium oxide with dual function characteristics of DRAM and storage class memory in the memory hierarchy. Atomic-resolution spherical aberration-corrected scanning transmission electron microscopy is employed to directly reveal the insights of phase evolution by utilizing diffractograms to determine lattice parameters. Storage-data-transfer-cycling-recovery with an alternating access scheme is introduced due to the characteristic of independent domains to exhibit multilevel states. Remanent polarization (Pr) can be restored, and 34 periods (3 × 1010 cycles/period) to accumulate 1.02 × 1012 switching cycles are demonstrated. The proposed method is effective in prolonging the endurance and evaluating the spatially resolved evolution of polarization.
| Original language | English |
|---|---|
| Pages (from-to) | 14342-14349 |
| Number of pages | 8 |
| Journal | ACS Applied Materials and Interfaces |
| Volume | 17 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2025 Mar 5 |
| Externally published | Yes |
Keywords
- antiferroelectric (AFE)
- antiferroelectric-like
- endurance
- ferroelectric (FE)
- nonvolatile memory (NVM)
- recovery
- volatile memory (VM)
ASJC Scopus subject areas
- General Materials Science
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