Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo; Deng Tzung Tang; Chien Jang Wu; Thomson Lai

doi:10.1364/AO.44.004205

Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo^*
, Deng Tzung Tang
, Chien Jang Wu
, Thomson Lai

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO₃ crystal is reported along with the measurement results from a real BGA substrate.

Original language	English
Pages (from-to)	4205-4210
Number of pages	6
Journal	Applied Optics
Volume	44
Issue number	20
DOIs	https://doi.org/10.1364/AO.44.004205
Publication status	Published - 2005 Jul 10
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.44.004205

Cite this

@article{82f8870a7dab41c087f16fa6523a5950,

title = "Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique",

abstract = "A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.",

author = "Kuo, \{Wen Kai\} and Tang, \{Deng Tzung\} and Wu, \{Chien Jang\} and Thomson Lai",

year = "2005",

month = jul,

day = "10",

doi = "10.1364/AO.44.004205",

language = "English",

volume = "44",

pages = "4205--4210",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optica Publishing Group",

number = "20",

}

TY - JOUR

T1 - Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

AU - Kuo, Wen Kai

AU - Tang, Deng Tzung

AU - Wu, Chien Jang

AU - Lai, Thomson

PY - 2005/7/10

Y1 - 2005/7/10

N2 - A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.

AB - A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.

UR - https://www.scopus.com/pages/publications/22944470201

UR - https://www.scopus.com/pages/publications/22944470201#tab=citedBy

U2 - 10.1364/AO.44.004205

DO - 10.1364/AO.44.004205

M3 - Article

AN - SCOPUS:22944470201

SN - 1559-128X

VL - 44

SP - 4205

EP - 4210

JO - Applied Optics

JF - Applied Optics

IS - 20

ER -

Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Abstract

ASJC Scopus subject areas

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