Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo; Deng Tzung Tang; Chien Jang Wu; Thomson Lai

doi:10.1364/AO.44.004205

Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo^*, Deng Tzung Tang, Chien Jang Wu, Thomson Lai

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO₃ crystal is reported along with the measurement results from a real BGA substrate.

Original language	English
Pages (from-to)	4205-4210
Number of pages	6
Journal	Applied Optics
Volume	44
Issue number	20
DOIs	https://doi.org/10.1364/AO.44.004205
Publication status	Published - 2005 Jul 10
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.44.004205

Cite this

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abstract = "A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.",

author = "Kuo, {Wen Kai} and Tang, {Deng Tzung} and Wu, {Chien Jang} and Thomson Lai",

year = "2005",

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AU - Wu, Chien Jang

AU - Lai, Thomson

PY - 2005/7/10

Y1 - 2005/7/10

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AB - A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.

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Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Abstract

ASJC Scopus subject areas

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