Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo, Deng Tzung Tang, Chien-Jang Wu, Thomson Lai

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.

    Original languageEnglish
    Pages (from-to)4205-4210
    Number of pages6
    JournalApplied Optics
    Volume44
    Issue number20
    DOIs
    Publication statusPublished - 2005 Jul 10

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

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