Abstract
The synthesis, X-ray structure analysis and electrochemical characterization of a series of chalcogen-rich, extensively conjugated, and in some cases fully planar tetrathiooxalato bridged dmit-based bimetallic Cu(II) and Ni(II) complexes for molecular conducting materials are reported. Also reported is the synthesis and temperature-dependent electrical conductivity of the new dmit based anion radical salt complex (CH3(C6H5)3P) [Ni(dmit)2]3.
| Original language | English |
|---|---|
| Pages (from-to) | 1791-1793 |
| Number of pages | 3 |
| Journal | Synthetic Metals |
| Volume | 86 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1997 Feb 28 |
| Externally published | Yes |
Keywords
- Conductivity
- Electrocrystallization
- Organic conductors
- Radical anion salt
- X-ray diffraction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
- Materials Chemistry