New electrically conducting materials based on the dmit ligand

A. E. Pullen, K. A. Abboud, J. R. Reynolds, J. Piotraschke, S. Zeltner, R. M. Olk, E. Hoyer, Hsiang Lin Liu, D. B. Tanner

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

The synthesis, X-ray structure analysis and electrochemical characterization of a series of chalcogen-rich, extensively conjugated, and in some cases fully planar tetrathiooxalato bridged dmit-based bimetallic Cu(II) and Ni(II) complexes for molecular conducting materials are reported. Also reported is the synthesis and temperature-dependent electrical conductivity of the new dmit based anion radical salt complex (CH3(C6H5)3P) [Ni(dmit)2]3.

Original languageEnglish
Pages (from-to)1791-1793
Number of pages3
JournalSynthetic Metals
Volume86
Issue number1-3
Publication statusPublished - 1997 Feb 28

Keywords

  • Conductivity
  • Electrocrystallization
  • Organic conductors
  • Radical anion salt
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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  • Cite this

    Pullen, A. E., Abboud, K. A., Reynolds, J. R., Piotraschke, J., Zeltner, S., Olk, R. M., Hoyer, E., Liu, H. L., & Tanner, D. B. (1997). New electrically conducting materials based on the dmit ligand. Synthetic Metals, 86(1-3), 1791-1793.