New electrically conducting materials based on the dmit ligand

A. E. Pullen*, K. A. Abboud, J. R. Reynolds, J. Piotraschke, S. Zeltner, R. M. Olk, E. Hoyer, Hsiang Lin Liu, D. B. Tanner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

The synthesis, X-ray structure analysis and electrochemical characterization of a series of chalcogen-rich, extensively conjugated, and in some cases fully planar tetrathiooxalato bridged dmit-based bimetallic Cu(II) and Ni(II) complexes for molecular conducting materials are reported. Also reported is the synthesis and temperature-dependent electrical conductivity of the new dmit based anion radical salt complex (CH3(C6H5)3P) [Ni(dmit)2]3.

Original languageEnglish
Pages (from-to)1791-1793
Number of pages3
JournalSynthetic Metals
Volume86
Issue number1-3
DOIs
Publication statusPublished - 1997 Feb 28

Keywords

  • Conductivity
  • Electrocrystallization
  • Organic conductors
  • Radical anion salt
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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