Negative bias temperature instability (NBTI) in deep sub-micron p+-gate pMOSFETs

Y. F. Chen*, M. H. Lin, C. H. Chou, W. C. Chang, S. C. Huang, Y. J. Chang, K. Y. Fu, M. T. Lee, C. H. Liu, S. K. Fan

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

20 Citations (Scopus)

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Engineering & Materials Science