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Dive into the research topics of 'Negative bias temperature instability (NBTI) in deep sub-micron p+-gate pMOSFETs'. Together they form a unique fingerprint.- Sort by
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Y. F. Chen*, M. H. Lin, C. H. Chou, W. C. Chang, S. C. Huang, Y. J. Chang, K. Y. Fu, M. T. Lee, C. H. Liu, S. K. Fan
Research output: Contribution to conference › Paper › peer-review