Negative bias temperature instability (NBTI) in deep sub-micron p+-gate pMOSFETs
- Y. F. Chen*
- , M. H. Lin
- , C. H. Chou
- , W. C. Chang
- , S. C. Huang
- , Y. J. Chang
- , K. Y. Fu
- , M. T. Lee
- , C. H. Liu
- , S. K. Fan
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review
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