NBTI mechanism explored on the back gate bias for pMOSFETs

M. G. Chen, J. S. Li, C. Jiang, C. H. Liu, K. C. Su, Y. H. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'NBTI mechanism explored on the back gate bias for pMOSFETs'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science