TY - GEN
T1 - Modified unsharp masking detection using Otsu thresholding and Gray code
AU - Lin, Chun Lin
AU - Su, Chung Yen
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/5/19
Y1 - 2016/5/19
N2 - In order to improve image quality, unsharp masking (USM) is a great solution for image enhancement. To detect USM sharpening, we propose an improved method called edge perpendicular Gray coding (EPGC). With EPGC, the number of feature points generated from binary encoding can be reduced to half and thus the execution of calculating histogram can be accelerated. In addition, we use Otsu thresholding to enhance Canny edge detection. As a result, the accuracy of USM detection is increased. Experimental results show that EPGC performs better than previous methods.
AB - In order to improve image quality, unsharp masking (USM) is a great solution for image enhancement. To detect USM sharpening, we propose an improved method called edge perpendicular Gray coding (EPGC). With EPGC, the number of feature points generated from binary encoding can be reduced to half and thus the execution of calculating histogram can be accelerated. In addition, we use Otsu thresholding to enhance Canny edge detection. As a result, the accuracy of USM detection is increased. Experimental results show that EPGC performs better than previous methods.
KW - Gray coding
KW - Otsu method
KW - unsharp masking sharpening
UR - http://www.scopus.com/inward/record.url?scp=84974627538&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84974627538&partnerID=8YFLogxK
U2 - 10.1109/ICIT.2016.7474851
DO - 10.1109/ICIT.2016.7474851
M3 - Conference contribution
AN - SCOPUS:84974627538
T3 - Proceedings of the IEEE International Conference on Industrial Technology
SP - 787
EP - 791
BT - Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Conference on Industrial Technology, ICIT 2016
Y2 - 14 March 2016 through 17 March 2016
ER -