Minimum ACPR "sweet-spot" using statistical power distribution function

Jeng-Han Tsai, Shih Yu Chen, Wei Chien Chen, Tian Wei Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

During the linearity optimization, the ACPR improvement is quite different from the intermodulation third-order distortion ratio (IM3R) improvement, but there exist some relation between ACPR and IM3R. To correlate the IM3R and ACPR, we propose the statistical probability density function (PDF) method to predict the relation between the ACPR improvement and the IM3R improvement for weekly nonlinear amplifiers. There is a 10 dB difference between measured ACPR and IM3R near sweet spot region, however, through our modification process, only 2-3dB difference between our theoretical prediction and measured ACPR exist. Two of the modulation signals, W-CDMA and QPSK, have been proved that the prediction of ACPR from two-tone IM3R can be much closed to the measured one as long as the modified PDF term is utilized.

Original languageEnglish
Title of host publication2006 Asia-Pacific Microwave Conference Proceedings, APMC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1743-1746
Number of pages4
ISBN (Print)4902339102, 9784902339109
DOIs
Publication statusPublished - 2006 Jan 1
Event2006 Asia-Pacific Microwave Conference, APMC - Yokohama, Japan
Duration: 2006 Dec 122006 Dec 15

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC
Volume3

Other

Other2006 Asia-Pacific Microwave Conference, APMC
CountryJapan
CityYokohama
Period06/12/1206/12/15

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Keywords

  • Adjacent channel power ratio
  • Inter-modulation distortion
  • Sweet spot

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Tsai, J-H., Chen, S. Y., Chen, W. C., & Huang, T. W. (2006). Minimum ACPR "sweet-spot" using statistical power distribution function. In 2006 Asia-Pacific Microwave Conference Proceedings, APMC (pp. 1743-1746). [4429746] (Asia-Pacific Microwave Conference Proceedings, APMC; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APMC.2006.4429746