Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films

J. S. Tsay; T. Y. Fu; M. H. Lin; C. S. Yang; Y. D. Yao

doi:10.1063/1.2185259

Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films

J. S. Tsay^*, T. Y. Fu, M. H. Lin, C. S. Yang, Y. D. Yao

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

44 Citations (Scopus)

Abstract

The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.

Original language	English
Article number	102506
Journal	Applied Physics Letters
Volume	88
Issue number	10
DOIs	https://doi.org/10.1063/1.2185259
Publication status	Published - 2006

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2185259

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title = "Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films",

abstract = "The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.",

author = "Tsay, {J. S.} and Fu, {T. Y.} and Lin, {M. H.} and Yang, {C. S.} and Yao, {Y. D.}",

note = "Funding Information: The authors wish to acknowledge support from the National Science Council of ROC under Contract No. NSC 93-2112-M-194-008. Their gratitude also goes to the Academic Paper Editing Clinic, National Taiwan Normal University.",

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AU - Tsay, J. S.

AU - Fu, T. Y.

AU - Lin, M. H.

AU - Yang, C. S.

AU - Yao, Y. D.

N1 - Funding Information: The authors wish to acknowledge support from the National Science Council of ROC under Contract No. NSC 93-2112-M-194-008. Their gratitude also goes to the Academic Paper Editing Clinic, National Taiwan Normal University.

PY - 2006

Y1 - 2006

N2 - The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.

AB - The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.

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Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films

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