Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films

J. S. Tsay, T. Y. Fu, M. H. Lin, C. S. Yang, Y. D. Yao

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The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.

Original languageEnglish
Article number102506
JournalApplied Physics Letters
Issue number10
Publication statusPublished - 2006 Mar 21


ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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