Engineering & Materials Science
Ion implantation
100%
Surface defects
89%
Atoms
76%
Irradiation
75%
Rutherford backscattering spectroscopy
68%
Surface roughness
61%
Defects
50%
Atomic force microscopy
47%
Surface structure
44%
Transmission electron microscopy
37%
Annealing
36%
Ions
34%
Fluxes
30%
Temperature
29%
Silicon
29%
Hot Temperature
17%
Experiments
13%
Chemical Compounds
Ion Implantation
90%
Surface Defect
87%
Surface Roughness
74%
Rutherford Backscattering Spectroscopy
47%
Surface Structure
35%
Displacement
30%
Reaction Yield
30%
Atomic Force Microscopy
29%
Annealing
29%
Transmission Electron Microscopy
24%
Ambient Reaction Temperature
20%
Energy
17%
Ion
14%
Surface
11%