Mechanism of threshold voltage shift (Δ Vth) caused by negative bias temperature instability (NBTI) in deep submicron pMOSFETs
- Chuan Hsi Liu*
- , Ming T. Lee
- , Chih Yung Lin
- , Jenkon Chen
- , Y. T. Loh
- , Fu Tai Liou
- , Klaus Schruefer
- , Anastasios A. Katsetos
- , Zhijian Yang
- , Nivo Rovedo
- , Terence B. Hook
- , Clement Wann
- , Tze Chiang Chen
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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