Abstract
A setup using fringe projection techniques to perform 3D profile measurements for transparent objects is presented. The related mathematical equations are derived as well. A fringe pattern is illuminated onto the transparent object. Fringes passing through the inspected object are then projected onto a screen. A CCD camera is employed to record the transmitted fringes on the screen. Fringe on the screen are deformed by the refractive index and the surface structure, and therefore are desirable to describe the shape of the inspected sample.
Original language | English |
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Title of host publication | Photonic Fiber and Crystal Devices |
Subtitle of host publication | Advances in Materials and Innovations in Device Applications XI |
Editors | Shizhuo Yin, Ruyan Guo |
Publisher | SPIE |
Volume | 10382 |
ISBN (Electronic) | 9781510612211 |
DOIs | |
Publication status | Published - 2017 Jan 1 |
Event | Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI 2017 - San Diego, United States Duration: 2017 Aug 6 → 2017 Aug 7 |
Other
Other | Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI 2017 |
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Country | United States |
City | San Diego |
Period | 2017/08/06 → 2017/08/07 |
Keywords
- fringe analysis
- fringe projection
- optical inspection
- projected fringe profilometry
- ray tracing
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering