Abstract
Magnetotransport data on MgB2 thin films, fabricated on Al 2O3 substrates using electron-bean deposition and Mg diffusion method are reported for applied magnetic fields up to 9 T. The upper critical field anisotropy, lower critical field and irreversibility field versus temperature are determined. The Hall coefficient is slightly temperature-dependent and positive in the normal state. Using the extracted data, the electronic mean free path, coherence length ξ0, anisotropic coefficient γ and penetration depth λ are calculated.
Original language | English |
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Pages (from-to) | 3723-3729 |
Number of pages | 7 |
Journal | International Journal of Modern Physics B |
Volume | 19 |
Issue number | 24 |
DOIs | |
Publication status | Published - 2005 Sept 30 |
Keywords
- Hall effect
- Magnetization
- Magnetotransport properties
- Thin films
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Condensed Matter Physics