Low Voltage High Polarization by Optimizing Scavenged WNx Interfacial Capping Layer at the Ru/HfxZr1-xO2 Interface and Evidence of Fatigue Mechanism
- Abhijit Aich
- , Asim Senapati
- , Zhao Feng Lou
- , Yi Pin Chen
- , Shih Yin Huang
- , Siddheswar Maikap*
- , Min Hung Lee*
- , Chee Wee Liu
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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