Low-temperature dephasing in irradiated metallic wires

Thibaut Capron*, Yasuhiro Niimi, François Mallet, Yannick Baines, Dominique Mailly, Fang Yuh Lo, Alexander Melnikov, Andreas D. Wieck, Laurent Saminadayar, Christopher Bäuerle

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


We present phase coherence time measurements in quasi-one-dimensional Ag wires implanted with Ag+ ions with an energy of 100 keV. The measurements have been carried out in the temperature range from 100 mK up to 10 K; this has to be compared with the Kondo temperature of iron in silver, i.e., TK AgFe ≈4 K, used in recent experiments on dephasing in Kondo systems. We show that the phase coherence time is not affected by the implantation procedure, clearly proving that ion implantation process by itself does not lead to any extra dephasing at low temperature.

Original languageEnglish
Article number033102
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number3
Publication statusPublished - 2008 Jan 17
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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