Low-frequency noise in n-channel metal-oxide-semiconductor field-effect transistors undergoing soft breakdown

Ming Jer Chen*, Ting Kuo Kang, Yuan Hwa Lee, Chuan Hsi Liu, Yih J. Chang, Kuan Yu Fu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

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Physics & Astronomy