Low field flux dynamics of Pr-doped Bi-2212 single crystals

Y. Y. Hsu, Y. Huang, H. C. Ku

Research output: Contribution to journalArticle

Abstract

Magnetic hysteresis M(H,T) and magnetic relaxation M(t) results on various Pr-doped single crystals Bi2Sr2Ca1-x PrxCu2O8+δ are reported. Superconducting H-T phase diagram with applied field parallel to single crystal c-axis indicates that with progressive Pr doping from optimum composition (x = 0.11, Tc = 88 K) to underdoped single crystal (x > 0.11), all characteristic field lines in H-T diagram shift to lower reduced temperature T/Tc and lower field region with narrower second peak (H2p) window. Low field magnetic relaxation data near H2p indicates a distinct change of flux creep behavior from collective creep model for field smaller than second peak onset field (Hon) to vortex glass model for H > Hon. Such a crossover behavior implies a change in vortex coupling mechanism from vortex quasi-latrice to entangled vortex glass.

Original languageEnglish
Pages (from-to)1159-1160
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume341-348
Issue numberPART 3
DOIs
Publication statusPublished - 2000 Jan 1

Fingerprint

Vortex flow
Single crystals
vortices
Fluxes
Magnetic relaxation
single crystals
magnetic relaxation
Creep
Magnetic hysteresis
Glass
glass
doped crystals
Phase diagrams
crossovers
hysteresis
diagrams
Doping (additives)
phase diagrams
shift
Chemical analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Low field flux dynamics of Pr-doped Bi-2212 single crystals. / Hsu, Y. Y.; Huang, Y.; Ku, H. C.

In: Physica C: Superconductivity and its Applications, Vol. 341-348, No. PART 3, 01.01.2000, p. 1159-1160.

Research output: Contribution to journalArticle

Hsu, Y. Y. ; Huang, Y. ; Ku, H. C. / Low field flux dynamics of Pr-doped Bi-2212 single crystals. In: Physica C: Superconductivity and its Applications. 2000 ; Vol. 341-348, No. PART 3. pp. 1159-1160.
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