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Low-field flux creep behavior near second peak H2p in Pr-doped Bi-2212 single crystal

  • Y. Y. Hsu*
  • , C. Y. Lin
  • , B. N. Lin
  • , Y. P. Sun
  • , H. C. Ku
    • *Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

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