Low-field flux creep behavior near second peak H2p in Pr-doped Bi-2212 single crystal

Y. Y. Hsu*, C. Y. Lin, B. N. Lin, Y. P. Sun, H. C. Ku

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Low-field flux creep behavior near second peak H<sub>2p</sub> in Pr-doped Bi-2212 single crystal'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy