Large area nanoparticle alignment by chemical lift-off lithography

  • Chong You Chen
  • , Chia Hsuan Chang
  • , Chang Ming Wang
  • , Yi Jing Li
  • , Hsiao Yuan Chu
  • , Hong Hseng Chan
  • , Yu Wei Huang
  • , Wei Ssu Liao*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Nanoparticle alignment on the substrate attracts considerable attention due to its wide application in different fields, such as mechanical control, small size electronics, bio/chemical sensing, molecular manipulation, and energy harvesting. However, precise nanoparticle positioning and deposition control with high fidelity are still challenging. Herein, a straightforward strategy for high quality nanoparticle-alignment by chemical lift-off lithography (CLL) is demonstrated. This technique creates high resolution self-assembled monolayer (SAM) chemical patterns on gold substrates, enabling nanoparticle-selective deposition and precise alignment. The fabricated nanoparticle arrangement geometries and dimensions are well-controllable in a large area. With proper nanoparticle surface functionality control and adequate substrate molecular manipulation, well-defined nanoparticle arrays with single-particle-wide alignment resolution are achieved.

Original languageEnglish
Article number71
JournalNanomaterials
Volume8
Issue number2
DOIs
Publication statusPublished - 2018 Feb
Externally publishedYes

Keywords

  • Chemical lift-off lithography
  • Nanoparticle
  • Patterning
  • Selective deposition
  • Self-assembled monolayer

ASJC Scopus subject areas

  • General Chemical Engineering
  • General Materials Science

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