Investigation the interaction between the pulsed ultraviolet laser beams and PEDOT:PSS/graphene composite films

Shih Feng Tseng, Wen Tse Hsiao, Chien Kai Chung, Tien Li Chang

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

This research aims to investigate the interaction between pulsed ultraviolet (UV) laser beams and transparent PEDOT:PSS/graphene composite films. The laser ablated microstructure on film surfaces provides the electrical isolation and prevents the electrical contact from each location for the projected capacitive touch screen. Before the laser processing, the surface roughness, microhardness, spectrum and cross-sectional view of PEDOT:PSS/graphene composite film were measured by an atomic force microscope, a nanoindenter, a spectrometer and a scanning electron microscope, respectively. The focused UV laser beam was irradiated along line patterns with an overlapping rate of 60% and the applied laser fluences much over the ablation thresholds of 1.27 J/cm 2 to 3.82 J/cm 2 . The surface morphology, three-dimensional topography, and cross-sectional profile of isolated lines and electrode structures after laser microstructuring were measured by a confocal laser scanning microscope. By increasing the laser fluence from 1.27 J/cm 2 to 3.82 J/cm 2 , the ablated line widths and depths increased from 12.17 ± 0.24 μm to 21 ± 0.37 μm and from 190 ± 9 nm to 227 ± 15 nm, respectively. Moreover, the ablated lines of microstructuring electrodes had a clear and regular ablated edge quality.

Original languageEnglish
Pages (from-to)486-491
Number of pages6
JournalApplied Surface Science
Volume356
DOIs
Publication statusPublished - 2015 Nov 30

Fingerprint

Ultraviolet lasers
Graphite
Composite films
Pulsed lasers
Graphene
Laser beams
Lasers
Microscopes
Scanning
Electrodes
Touch screens
Ablation
Linewidth
Microhardness
Topography
Surface morphology
poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate)
Spectrometers
Electron microscopes
Surface roughness

Keywords

  • Ablated line
  • Edge quality
  • Microstructuring electrode
  • PEDOT:PSS/graphene composite film
  • Ultraviolet laser

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Investigation the interaction between the pulsed ultraviolet laser beams and PEDOT:PSS/graphene composite films. / Tseng, Shih Feng; Hsiao, Wen Tse; Chung, Chien Kai; Chang, Tien Li.

In: Applied Surface Science, Vol. 356, 30.11.2015, p. 486-491.

Research output: Contribution to journalArticle

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abstract = "This research aims to investigate the interaction between pulsed ultraviolet (UV) laser beams and transparent PEDOT:PSS/graphene composite films. The laser ablated microstructure on film surfaces provides the electrical isolation and prevents the electrical contact from each location for the projected capacitive touch screen. Before the laser processing, the surface roughness, microhardness, spectrum and cross-sectional view of PEDOT:PSS/graphene composite film were measured by an atomic force microscope, a nanoindenter, a spectrometer and a scanning electron microscope, respectively. The focused UV laser beam was irradiated along line patterns with an overlapping rate of 60{\%} and the applied laser fluences much over the ablation thresholds of 1.27 J/cm 2 to 3.82 J/cm 2 . The surface morphology, three-dimensional topography, and cross-sectional profile of isolated lines and electrode structures after laser microstructuring were measured by a confocal laser scanning microscope. By increasing the laser fluence from 1.27 J/cm 2 to 3.82 J/cm 2 , the ablated line widths and depths increased from 12.17 ± 0.24 μm to 21 ± 0.37 μm and from 190 ± 9 nm to 227 ± 15 nm, respectively. Moreover, the ablated lines of microstructuring electrodes had a clear and regular ablated edge quality.",
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