Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process

Chun Yu Lin, Yan Lian Chiu

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits.

Original languageEnglish
Pages (from-to)2229-2235
Number of pages7
JournalMicroelectronics Reliability
Volume55
Issue number11
DOIs
Publication statusPublished - 2015 Jan 1

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Keywords

  • Biomedical
  • CMOS
  • Electrostatic discharge (ESD)
  • Silicon-controlled rectifier (SCR)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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