Investigation on CDM ESD events at core circuits in a 65-nm CMOS process

Chun Yu Lin*, Tang Long Chang, Ming Dou Ker

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Investigation on CDM ESD events at core circuits in a 65-nm CMOS process'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds