Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology

Guo Lun Huang, Wei Hao Fu, Chun-Yu Lin

Research output: Contribution to journalArticle

Abstract

BiCMOS technologies have been used to implement the radio-frequency (RF) integrated circuits (ICs) due to the advantages of low noise, low power consumption, high drive, and high speed. The electrostatic discharge (ESD) is one of the important reliability issues of IC. When the ESD events happen, the ESD protection devices must be turned on immediately to protect the ICs, including the RF ICs in BiCMOS technologies. In this work, the vertical NPN (VNPN) devices in 0.18 μm silicon-germanium (SiGe) BiCMOS technology with base-emitter shorted and resistor trigger approaches are investigated. In component-level, using transmission-line-pulsing (TLP) and ESD simulator test the I–V characteristics and human-body-model (HBM) robustness of the VNPN devices, respectively. In system-level, using ESD gun tests the system-level ESD robustness. The ESD protection of VNPN devices are further applied to a 2.4 GHz low-noise amplifier (LNA). After attaching the VNPN devices to LNA, the RF characteristics are not degraded while the ESD robustness can be much improved.

Original languageEnglish
Pages (from-to)271-280
Number of pages10
JournalMicroelectronics Reliability
Volume83
DOIs
Publication statusPublished - 2018 Apr 1

Fingerprint

BiCMOS technology
Electrostatic discharge
radio frequencies
electrostatics
integrated circuits
Integrated circuits
low noise
Low noise amplifiers
amplifiers
Germanium
human body
Silicon
resistors
Resistors
simulators
transmission lines
Electric lines
germanium
emitters
Electric power utilization

Keywords

  • BiCMOS technology
  • Electrostatic discharge (ESD)
  • Low-noise amplifier (LNA)
  • Radio-frequency (RF)
  • Vertical NPN (VNPN)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. / Huang, Guo Lun; Fu, Wei Hao; Lin, Chun-Yu.

In: Microelectronics Reliability, Vol. 83, 01.04.2018, p. 271-280.

Research output: Contribution to journalArticle

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