Interfacial and electrical characterization of hfo 2 -gated MOSCs and MOSFETs by C-V and gated-diode method

S. Y. Chen, H. W. Chen, C. H. Chen, F. C. Chiu, Chuan-Hsi Liu, Z. Y. Hsieh, H. S. Huang, H. L. Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

Metal-oxide-semiconductor capacitors (MOSCs) and Metal-oxidesemiconductor field-effect transistors (MOSFETs) incorporating hafnium dioxide (HfO 2 ) dielectrics were fabricated and investigated. The electrical and interfacial properties were characterized including C-V, I ds -V gs , the mean density of interface traps per unit area and energy (D̄ it ,), energy of interface traps density distribution, interface traps density (N it ), density of near-interface oxide traps per unit area (N niot ), effective capture cross-section area (σ s ,), minority carrier lifetime (τ fij ) and surface recombination velocity (s o ) were studied. Furthermore, a comparison with MOSFETs using conventional SiO 2 as gate dielectrics was also made.

Original languageEnglish
Title of host publicationECS Transactions - Physics and Technology of High-k Gate Dielectrics 6
Pages131-138
Number of pages8
Edition5
DOIs
Publication statusPublished - 2008 Dec 1
EventPhysics and Technology of High-k Gate Dielectrics 6 - 214th ECS Meeting - Honolulu, HI, United States
Duration: 2008 Oct 132008 Oct 15

Publication series

NameECS Transactions
Number5
Volume16
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

OtherPhysics and Technology of High-k Gate Dielectrics 6 - 214th ECS Meeting
CountryUnited States
CityHonolulu, HI
Period08/10/1308/10/15

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Chen, S. Y., Chen, H. W., Chen, C. H., Chiu, F. C., Liu, C-H., Hsieh, Z. Y., Huang, H. S., & Hwang, H. L. (2008). Interfacial and electrical characterization of hfo 2 -gated MOSCs and MOSFETs by C-V and gated-diode method In ECS Transactions - Physics and Technology of High-k Gate Dielectrics 6 (5 ed., pp. 131-138). (ECS Transactions; Vol. 16, No. 5). https://doi.org/10.1149/1.2981594