TY - GEN
T1 - Intelligent random vector generator based on probability analysis of circuit structure
AU - Kuo, Yu Min
AU - Lin, Cheng Hung
AU - Wang, Chun Yao
AU - Chang, Shih Chieh
AU - Ho, Pei Hsin
PY - 2007
Y1 - 2007
N2 - Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.
AB - Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.
UR - http://www.scopus.com/inward/record.url?scp=34548128221&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34548128221&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2007.91
DO - 10.1109/ISQED.2007.91
M3 - Conference contribution
AN - SCOPUS:34548128221
SN - 0769527957
SN - 9780769527956
T3 - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
SP - 344
EP - 349
BT - Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
T2 - 8th International Symposium on Quality Electronic Design, ISQED 2007
Y2 - 26 March 2007 through 28 March 2007
ER -