Intelligent random vector generator based on probability analysis of circuit structure

Yu Min Kuo, Cheng Hung Lin, Chun Yao Wang, Shih Chieh Chang, Pei Hsin Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.

Original languageEnglish
Title of host publicationProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
Pages344-349
Number of pages6
DOIs
Publication statusPublished - 2007 Aug 28
Event8th International Symposium on Quality Electronic Design, ISQED 2007 - San Jose, CA, United States
Duration: 2007 Mar 262007 Mar 28

Publication series

NameProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Other

Other8th International Symposium on Quality Electronic Design, ISQED 2007
CountryUnited States
CitySan Jose, CA
Period07/3/2607/3/28

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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