Integrating edge detector and bilateral noise filter for enhancing color images

Wen Chung Kao, Ying Ju Chen, Chia Ping Shen, Chi Wu Huang, Sheng Yuan Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Removing noises while preserving and enhancing edges is one of the most fundamental operations of image/video processing. The difficulty is that usually the filtering will reduce the sharpness of the image. On the other hand, optical lens and some circuitry imperfections are usually equivalent to spatial low pass filters and tend to result in blurred images. It is customary to apply edge enhancement algorithm on the image in order to improve the sharpness, but this process usually increases the noise level as a by-product. In this paper, we present a new integrated approach to address these issues. The proposed approach combines color edge detection, bilateral noise filter, and edge enhancement based on suitable color spaces. The experimental results show that the proposed approach can effectively reduce the noises while preserving and enhancing edges.

Original languageEnglish
Title of host publicationISCAS 2006
Subtitle of host publication2006 IEEE International Symposium on Circuits and Systems, Proceedings
Pages4675-4678
Number of pages4
Publication statusPublished - 2006 Dec 1
EventISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems - Kos, Greece
Duration: 2006 May 212006 May 24

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

OtherISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems
CountryGreece
CityKos
Period06/5/2106/5/24

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Kao, W. C., Chen, Y. J., Shen, C. P., Huang, C. W., & Lin, S. Y. (2006). Integrating edge detector and bilateral noise filter for enhancing color images. In ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings (pp. 4675-4678). [1693673] (Proceedings - IEEE International Symposium on Circuits and Systems).