Infrared and X-ray absorption studies of CdTe thin films

Wenjie Wang, Yu Cheng Yang, Ting Shan Chan, Peng Chen, Tzuen Rong Yang, Zhe Chuan Feng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CdTe is an important material for thin film solar cells and radiation detectors, and with very small lattice mismatch of about 0.01% to InSb. Here, we study on a series of CdTe thin films on InSb substrate under different ion time and temperature from molecular beam epitaxy (MBE), by infrared reflectance (IRR) spectroscopy and extended X-ray absorption fine structure (EXAFS). Samples were measured by infrared reflectance spectroscopy. Simulation/fittings were performed to obtain their values of transverse optical (TO) phonon frequency, damping constant, mode strength, carrier concentration, etc. The local atomic structure and phonon properties as well as effects by the ion cleaning conditions are obtained. Samples were also measured by extended X-ray absorption fine structure (EXAFS). X-ray absorption spectra were collected at Cd K-edge (∼26711 eV) in 26500-27700 eV and X-ray fluorescence yield mode. After data processing, Fourier transform and program fittings, the bond lengths of the 1st nearest Cd-Te and 2nd nearest Cd-Cd atomic bonding as well as the coordination numbers are obtained.

Original languageEnglish
Title of host publicationThin Film Solar Technology IV
DOIs
Publication statusPublished - 2012 Dec 1
EventThin Film Solar Technology IV - San Diego, CA, United States
Duration: 2013 Aug 122013 Aug 13

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8470
ISSN (Print)0277-786X

Other

OtherThin Film Solar Technology IV
CountryUnited States
CitySan Diego, CA
Period13/8/1213/8/13

Fingerprint

CdTe
X ray absorption
Thin Films
Infrared
Absorption
Infrared radiation
Thin films
Fine Structure
Phonon
thin films
Reflectance
Spectroscopy
Ions
Radiation detectors
Lattice mismatch
x rays
fine structure
Bond length
Radiation Detectors
Thin Film Solar Cells

Keywords

  • Atomic bond
  • CdTe/InSb
  • Infrared reflectance
  • MBE
  • Phonon
  • Synchrotron radiation
  • X-ray absorption

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Wang, W., Yang, Y. C., Chan, T. S., Chen, P., Yang, T. R., & Feng, Z. C. (2012). Infrared and X-ray absorption studies of CdTe thin films. In Thin Film Solar Technology IV [84700T] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8470). https://doi.org/10.1117/12.929001

Infrared and X-ray absorption studies of CdTe thin films. / Wang, Wenjie; Yang, Yu Cheng; Chan, Ting Shan; Chen, Peng; Yang, Tzuen Rong; Feng, Zhe Chuan.

Thin Film Solar Technology IV. 2012. 84700T (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8470).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wang, W, Yang, YC, Chan, TS, Chen, P, Yang, TR & Feng, ZC 2012, Infrared and X-ray absorption studies of CdTe thin films. in Thin Film Solar Technology IV., 84700T, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8470, Thin Film Solar Technology IV, San Diego, CA, United States, 13/8/12. https://doi.org/10.1117/12.929001
Wang W, Yang YC, Chan TS, Chen P, Yang TR, Feng ZC. Infrared and X-ray absorption studies of CdTe thin films. In Thin Film Solar Technology IV. 2012. 84700T. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.929001
Wang, Wenjie ; Yang, Yu Cheng ; Chan, Ting Shan ; Chen, Peng ; Yang, Tzuen Rong ; Feng, Zhe Chuan. / Infrared and X-ray absorption studies of CdTe thin films. Thin Film Solar Technology IV. 2012. (Proceedings of SPIE - The International Society for Optical Engineering).
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