Information Photonics: introduction to the feature issue

Jung Ping Liu; Yuan Luo; Chau Jern Cheng; Yoshio Hayasaki; Malgorzata Kujawinska; Ting Chung Poon

doi:10.1364/AO.542961

Information Photonics: introduction to the feature issue

Jung Ping Liu^*, Yuan Luo, Chau Jern Cheng, Yoshio Hayasaki, Malgorzata Kujawinska, Ting Chung Poon

^*Corresponding author for this work

Undergraduate Program of Electro-Optical Engineering

Research output: Contribution to journal › Review article › peer-review

Abstract

This feature issue of Applied Optics is dedicated to the international meeting of Information Photonics 2023 (IP2023) that was held on the 8th and 9th of September 2023 in New Taipei, Taiwan. IP2023 covers various topics, including information acquisition, information processing, metaverse photonics, information display, optical imaging, and optical metrology.

Original language	English
Pages (from-to)	IP1-IP2
Journal	Applied Optics
Volume	63
Issue number	28
DOIs	https://doi.org/10.1364/AO.542961
Publication status	Published - 2024 Oct 1

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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Cite this

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abstract = "This feature issue of Applied Optics is dedicated to the international meeting of Information Photonics 2023 (IP2023) that was held on the 8th and 9th of September 2023 in New Taipei, Taiwan. IP2023 covers various topics, including information acquisition, information processing, metaverse photonics, information display, optical imaging, and optical metrology.",

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AU - Liu, Jung Ping

AU - Luo, Yuan

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AU - Hayasaki, Yoshio

AU - Kujawinska, Malgorzata

AU - Poon, Ting Chung

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AB - This feature issue of Applied Optics is dedicated to the international meeting of Information Photonics 2023 (IP2023) that was held on the 8th and 9th of September 2023 in New Taipei, Taiwan. IP2023 covers various topics, including information acquisition, information processing, metaverse photonics, information display, optical imaging, and optical metrology.

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Information Photonics: introduction to the feature issue

Abstract

ASJC Scopus subject areas

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