Influence of chromium in co/cr(100) multilayers

Y. Liou, Ching Ray Chang, Chi-Kuen Lo, C. P. Chang, Y. D. Yao, Ivo Klik

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

-Using magneto-optic Kerr effect on Co/Cr epitaxially grown multilayers, we observed an ordering transition of the Co layers with the variation of Cr thickness. Both the coercivity and the squareness show that ferromagnetic coupling exists at thick Cr layers and antiferromagnetic coupling at thin Cr layers. The ordering transition of Co appears around the 5-10 A of Cr.

Original languageEnglish
Pages (from-to)3652-3654
Number of pages3
JournalIEEE Transactions on Magnetics
Volume33
Issue number5 PART 2
DOIs
Publication statusPublished - 1997 Dec 1

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Magnetooptical effects
Chromium
Coercive force
Multilayers

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Liou, Y., Chang, C. R., Lo, C-K., Chang, C. P., Yao, Y. D., & Klik, I. (1997). Influence of chromium in co/cr(100) multilayers. IEEE Transactions on Magnetics, 33(5 PART 2), 3652-3654. https://doi.org/10.1109/20.619527

Influence of chromium in co/cr(100) multilayers. / Liou, Y.; Chang, Ching Ray; Lo, Chi-Kuen; Chang, C. P.; Yao, Y. D.; Klik, Ivo.

In: IEEE Transactions on Magnetics, Vol. 33, No. 5 PART 2, 01.12.1997, p. 3652-3654.

Research output: Contribution to journalArticle

Liou, Y, Chang, CR, Lo, C-K, Chang, CP, Yao, YD & Klik, I 1997, 'Influence of chromium in co/cr(100) multilayers', IEEE Transactions on Magnetics, vol. 33, no. 5 PART 2, pp. 3652-3654. https://doi.org/10.1109/20.619527
Liou Y, Chang CR, Lo C-K, Chang CP, Yao YD, Klik I. Influence of chromium in co/cr(100) multilayers. IEEE Transactions on Magnetics. 1997 Dec 1;33(5 PART 2):3652-3654. https://doi.org/10.1109/20.619527
Liou, Y. ; Chang, Ching Ray ; Lo, Chi-Kuen ; Chang, C. P. ; Yao, Y. D. ; Klik, Ivo. / Influence of chromium in co/cr(100) multilayers. In: IEEE Transactions on Magnetics. 1997 ; Vol. 33, No. 5 PART 2. pp. 3652-3654.
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