Influence of bicrystal microstructural defects on high-transition- temperature direct-current superconducting quantum interference device

C. H. Wu, U. C. Sou, J. C. Chen, K. L. Chen, H. C. Yang^*, M. H. Hsu, T. S. Lai, J. T. Jeng, Y. S. Tsai, H. E. Horng

^*Corresponding author for this work