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Improving ESD robustness of stacked diodes with embedded SCR for RF applications in 65-nm CMOS
- Chun Yu Lin
- , Mei Lian Fan
- , Ming Dou Ker
- , Li Wei Chu
- , Jen Chou Tseng
- , Ming Hsiang Song
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
15
Citations
(Scopus)